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IEEE 2818-2024

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Soveltamisala

New IEEE Standard - Active. This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.

Julkaisun tiedot

  • Standardi julkaisijalta IEEE
  • Julkaistu:
  • Julkaisutyyppi: IS
  • Julkaisija IEEE
  • Jakelija IEEE
  • ICS 29.020
  • Tekninen komitea IEEE Reliability Society / IEEE Reliability Society Standards Committee

Sidokset

  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI/VITA 47.3-2019, Plug-In Module Standard for Environments, Design and Construction, Safety, and Quality - Class 3 Requirements.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ECSS-Q-ST-30-11C Rev 1, Derating - EEE components (4 October 2011).
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI/VITA 47.0-2019, Plug-In Module Standard for Environments, Design and Construction, Safety, and Quality.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI/VITA 47.2-2019, Plug-In Module Standard for Environments, Design and Construction, Safety, and Quality - Class 2 Requirements.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: SAE-GEIA-STD-0008, Derating of Electronic Components.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI/VITA 47.1-2019, Plug-In Module Standard for Environments, Design and Construction, Safety, and Quality - Common Requirements.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: MIL-HDBK-1547, Military Standard: Electronic Parts, Materials, and Processes for Space and Launch Vehicles.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: NASA EEE-INST-002, Instructions for IEEE Parts Selection, Screening, Qualification, and Derating [NASA Electronic Parts and Packaging (NEPP)] (April 2008).
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IPC-J-STD-001G, Requirements for Soldered Electrical and Electronic Assemblies, October 2017.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: SD-18, Parts Requirements and Application Guide, Naval Sea Systems Command.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI/VITA 51.2-2016, Physics of Failure Reliability Predictions.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: RAMS 2020, Optimized Derating to Support Reliable Systems Design, B. Caldwell, L. Bechtold, B. Douty, J. Murray, Reliability and Maintainability Symposium, 2020 (IEEE).